Keithley Model 2651A High Power System SourceMeter® SMU Instrument, (±40 V@± 50 A) Pulse, (±10V@±20A, ±20V@±10A, ±40V@±5A) DC
The high power Model 2651A SourceMeter SMU Instrument is specifically designed for (pulsed) I-V characterization and tests on high power electronics . This SMU instrument helps improving productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies .
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Productspecificaties
Meer informatie
Fabrikant
Keithley Instruments
Art.nr.
TEK-2651A
Documentatie
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The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power.
Key Features
Source or sink: – 2,000W of pulsed power (±40V, ±50A) – 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)
Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
1pA resolution enables precise measurement of very low leakage currents
1µs per point (1MHz), 18-bit sampling, accurately characterizes transient behavior
1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device- specific drive stimulus
Combines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller—all in one instrument
Includes TsP® Express I-V characterization software, labVIEW® driver, and Keithley’s Test script builder software development environment
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