IM7581

Hioki LCR Meters and s range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components. The IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.

Key Features

• 100 kHz to 300 MHz testing source frequency
• Fastest test speed of 0.5 msec (Analog measurement time)
• ±0.72% rdg. basic accuracy
• Half-rack size body and palm-sized test head
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode