Description
Wentworth Laboratories, with over 50 years of experience, has the ability to create customized and integrated wafer probing solutions.
The extensive range of standard wafer probe stations, which includes a wide selection of options and assessories, covers most common test needs in semiconductor test. If the application cannot be realized with the standard offering, Wentworth can configure a customized solution meeting the specific requirements at an affordable cost.
Several solutions for different applications have been realized. Examples include a Dual-stage prober 12" integrating sphere to test medical imaging devices on wafer, a Flying Arm Prober to enable testing of irregular probing geometries on large devices or panels, a 360° Chuck to enable simultaneous probing and sensing, and a Laser System to measure the deflection angle on MEMS devices.