Wentworth Cantilever Probe Cards

Wentworth Laboratories has specialist Probe Card facilities based in Europe and North America, where standard cantilever probe cards based on epoxy and blade technologies are built.   

Epoxy Probe cards can be used in Wentworths probe stations, but can also be used with other manufactures' wafer probers. Epoxy cards can have a high pin count, and are a cost-effective solution for most probing requirements.  Each prober card is made to customer's requirements including:

• number of probes
• Probe and PCB material
• Pitch
• Leakage in the nA or pA range

Low Leakage Epoxy Probe Cards deliver ultra-low leakage Peformance

• operating in fA range at voltages up to 30 V
• small pitches down to 50 µm
• designed for use with Keithley and Keysight Parametric Analyzers
• use of superior materials for probe needles includingTungsten (W), Tungsten Rhenium (WRe), Beryllium Copper (BeCu) and Palladium allow (Pd)
• extensively tested on leakage and continuity

• designed to withstand 10 kV and more depending on test setup
• featuring a compressed air chamber to supress flashovers (arcing) during test
• can operate up to 250 ´C

• capable of operating up to 200 A Pulsed Current and beyond.
• multi-contact design to avoid device heating and pad burnout
• an added Kelvin sense probe measures current on the device
• can operate up to 250 ´C

• up to +300 ´C
• suitable for hot chuck applications and can be mounted on manipulators