MPI
MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.
SKU | MPI- TS150-HP |
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Manufacturer | MPI |
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Microscope Mount and Movement
Adjustable Platen Height
Probe Platen
Unique Platen Lift
Platen Arc Shield
Front Mounted Vacuum Control
Microscope and Optics Options
Positioners and High Power Probes
Chuck XY Stage Movement