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TS150-HP

MPI

TS150-HP

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

Price on Request

Product specifications

SKU MPI- TS150-HP
Manufacturer MPI

Documentation

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Description

Microscope Mount and Movement

  • Stable bridge for high quality optics
  • Linear z lift for easy reconfiguration
  • 25 x 25 mm air bearing or 50 x 50 mm linear XY movement

Adjustable Platen Height

  • Micrometer control for precise adjustment
  • 20 mm range for various applications

Probe Platen

  • Stable and rigid design
  • Supports DC/CV, RF and High Power measurements
  • Rectangular adjustments for RF positioners
  • Designed for maximum thermal stability

Unique Platen Lift

  • Three discrete positions for contact, separation (300 µm) and safety loading (3 mm)
  • Safety lock function at loading position
  • “Auto Contact“ position with ±1 µm repeatability for consistent contact quality

Platen Arc Shield

  • Designed for safe operation
  • Prevents platen high voltage arching from chuck

Front Mounted Vacuum Control

  • Easy access
  • Clearly marked

Microscope and Optics Options

  • Various optics options available
  • Stereo MPI ST45 or single tube MPI SZ10, MZ12 with up to 12x zoom and 95 mm working distance
  • High Power microscopes FS70/PSM-1000
  • HDMI cameras, monitor user interface without computer

Positioners and High Power Probes

  • Supports up to 4 high current and 8 high voltage positioners
  • Various positioners available
  • Dedicated Coax and Triax high voltage and high current probe arms (up to 600 A pulse) Modular Chucks
  • Various non-thermal and thermal chucks
  • Wide range of temperature up to 300°C
  • Thin wafer handling capability
  • 10 kV (Coax), 3 kV (Triax)
  • Gold plated for low contact resistance
  • MPI chuck connectors for safe instrument connection

Chuck XY Stage Movement

  • Unique puck controlled air bearing stage for quick single-handed operation
  • 180 x 230 mm XY total stage movement
  • Resolution < 1.0 µm (0.04 mils) @ 500 µm/rev • Extra wide Y-range for easy loading
  • ±5° Theta fine adjustment