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MPI TS2000-SE

200 mm Automated Probe System with ShielDEnvironment™, for most accurate and reliable DC/CV, RF and mmW measurements

Price on Request

MPI TS150

MPI TS150 is an open, easy to use and cost effective manual probe system designed for precision analysis of substrates and wafers up to 150mm.

Price on Request

TS150-HP

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

Price on Request

TS200-HP

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

Price on Request