MPI TS2000-SE
200 mm Automated Probe System with ShielDEnvironment™, for most accurate and reliable DC/CV, RF and mmW measurements
200 mm Automated Probe System with ShielDEnvironment™, for most accurate and reliable DC/CV, RF and mmW measurements
MPI TS150 is an open, easy to use and cost effective manual probe system designed for precision analysis of substrates and wafers up to 150mm.
MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP probe systems provide a complete 150 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.
MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.