Semiconductor

CN Rood offers solutions for characterising semiconductor components and structures. This covers not only the characterisation of direct voltage (DC) and pulsed current voltage, but also about the characterisation of impedance (AC) and capacitance versus voltage. We can supply instrumentation for product development and fault analysis with the emphasis on graphic display, as well as quick system solutions used in manufacturing, such as parameter extraction and/or reliability tests.

In addition to instrumentation, CN Rood supplies mechanical systems for contacting structures at wafer level.

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4200-BTI-A
4200-BTI-A
Keithley Instruments
Keithley 4200-BTI-A, High Resolution and Power IV & CV package for power devices, high κ dielectric, deep submicron CMOS device characterization
Price on Request
4200A-SCS-PK3
4200A-SCS-PK3
Keithley Instruments
Keithley 4200A-SCS-PK3, High Resolution and Power IV & CV package for power devices, high κ dielectric, deep submicron CMOS device characterization
Price on Request
4200A-SCS-PK2
4200A-SCS-PK2
Keithley Instruments
Keithley 4200A-SCS-PK2, High Resolution IV & CV package for high κ dielectric, deep submicron CMOS characterization
Price on Request
4200A-SCS-PK1
4200A-SCS-PK1
Keithley Instruments
Keithley 4200A-SCS-PK1, high resolution I-V package for two- and three-terminal devices, MOSFET, CMOS characterization
Price on Request
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