CN Rood offers solutions for characterising semiconductor components and structures. This covers not only the characterisation of direct voltage (DC) and pulsed current voltage, but also about the characterisation of impedance (AC) and capacitance versus voltage. We can supply instrumentation for product development and fault analysis with the emphasis on graphic display, as well as quick system solutions used in manufacturing, such as parameter extraction and/or reliability tests.
In addition to instrumentation, CN Rood supplies mechanical systems for contacting structures at wafer level.
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