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The functional test consists of the actual test of the printed circuit board (PCB) or a complete module. During this test, all of the UUT (Unit Under Test) functions are tested. The various components for this test are commonly tested individually to make the diagnosis of any faults less ambiguous. You can carry out a functional test with modular test systems or by assembling test systems yourself.
The TS-900 PXI Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top.
Pickering's range of PXI Fault/Signal Insertion Unit (FIU) switch products are designed specifically for safety critical applications where the response of a control system is required.
Pickering's PXI Digital I/O Modules are suitable for operating external devices or for interfacing with external logic. PXI Prototyping Modules are breadboard modules available either with or without digital I/O.
Pickering's PXI Amplifier and Attenuator Modules include our accurate DC to 3GHz programmable attenuator has a 1dB step resolution, allowing it to adjust signal amplitudes for optimum measurement by other devices.
